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Etching Control of HfN Encapsulating Layer for PtHf-Silicide Formation with Dopant Segregation Process.
Shun'ichiro Ohmi
Yuya Tsukamoto
Rengie Mark D. Mailig
Published in:
IEICE Trans. Electron. (2019)
Keyphrases
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process control
process model
control structure
databases
machine learning
information retrieval
social networks
multiscale
design process
control theory
feedback loop