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A BIST scheme for RTL circuits based on symbolic testabilityanalysis.
Indradeep Ghosh
Niraj K. Jha
Sudipta Bhawmik
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2000)
Keyphrases
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detection scheme
high level
high speed
databases
neural network
decision trees
model based diagnosis
symbolic representation
multiscale
classification scheme
learning scheme
circuit design
recognition scheme