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Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors.
Sébastien Haendler
Jalal Jomaah
Gérard Ghibaudo
Francis Balestra
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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low frequency
high frequency
image analysis
wavelet transform
wavelet analysis
subband
high quality
high resolution
power consumption
discrete wavelet transform
high frequency components
low and high frequency