Triple Patterning Lithography (TPL) Layout Decomposition using End-Cutting (JM3 Special Session).

Bei Yu Subhendu Roy Jhih-Rong Gao David Z. Pan

Published in: CoRR (2014)

Keyphrases

special session
image and video retrieval
invited paper
program committee
computational intelligence
researchers and practitioners
artificial neural networks
computer vision
image sequences
machine learning
information retrieval
information technology
high profile