Digital oscillation-test method for delay and stuck-at fault testing of digital circuits.

Karim Arabi Hassan Ihs Christian Dufaza Bozena Kaminska

Published in: ITC (1998)

Keyphrases

test data
high accuracy
detection method
cost function
digital circuits
dynamic programming
significant improvement
databases
neural network
multi agent
preprocessing
data management
clustering method
segmentation method
matching algorithm
constraint satisfaction