A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit.

Meng-Chi Chen Tsung-Hsuan Wu Cheng-Wen Wu

Published in: ATS (2018)

Keyphrases

power consumption
built in self test
image processing
high speed
data transmission
detection scheme
cmos technology
video sequences
circuit design
low voltage
random access memory
defect classification