Login / Signup
films.
V. Em. Vamvakas
M. Theodoropoulou
Stavroula N. Georga
Christoforos A. Krontiras
M. N. Pisanias
Published in:
Microelectron. Reliab. (2007)
Keyphrases
</>
ni fe
film restoration
grain size
real time
databases
lower bound
artificial neural networks
image analysis
dynamic programming
film thickness