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Hot spots suppression by high thermal conductivity film in thin-sub strate CMOS ICs for 3D integration.

Fumiki KatoKatsuya KikuchiHiroshi NakagawaMasahiro Aoyagi
Published in: 3DIC (2011)
Keyphrases
  • hot spots
  • thermal conductivity
  • high speed
  • information integration
  • power consumption
  • image processing
  • edge detection
  • high precision
  • data acquisition