A straightforward electrical method to determine screening capability of GOX extrinsics in arbitrary, commercially available SiC MOSFETs.
Judith BerensThomas AichingerPublished in: IRPS (2021)
Keyphrases
- high accuracy
- detection method
- significant improvement
- preprocessing
- main contribution
- theoretical analysis
- high precision
- clustering method
- cost function
- prior knowledge
- image analysis
- computational complexity
- learning algorithm
- similarity measure
- feature extraction
- error rate
- optimization method
- support vector machine svm
- edge detection
- support vector machine
- dynamic programming
- objective function