Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices.
Qinsong QianSiyang LiuWeifeng SunHu SunPublished in: Microelectron. J. (2011)
Keyphrases
- high levels
- power consumption
- low power consumption
- inversely proportional
- significantly lower
- electrical power
- high noise
- high sensitivity
- high rate
- power losses
- high correlation
- mobile devices
- highly correlated
- power system
- wide range
- transmission line
- operating conditions
- low signal to noise ratio
- single phase
- context aware
- high speed
- high voltage