On-Chip IDDQ Testing in the AE11 Fail-Stop Controller.

Eberhard Böhl Thomas Lindenkreuz Matthias Meerwein

Published in: IEEE Des. Test Comput. (1998)

Keyphrases

control system
low cost
high speed
real time
test cases
closed loop
controller design
physical design
dynamic model
optimal control
high density
correlation analysis
analog vlsi
circuit design
fuzzy logic controller
software testing
control strategy
sufficient conditions
neural network