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Efficient Reliability Analysis of Processor Datapath using Atomistic BTI Variability Models.
Dimitrios Stamoulis
Dimitrios Rodopoulos
Brett H. Meyer
Dimitrios Soudris
Francky Catthoor
Zeljko Zilic
Published in:
ACM Great Lakes Symposium on VLSI (2015)
Keyphrases
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reliability analysis
case study
relational databases
probabilistic model
statistical models