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Efficient Reliability Analysis of Processor Datapath using Atomistic BTI Variability Models.

Dimitrios StamoulisDimitrios RodopoulosBrett H. MeyerDimitrios SoudrisFrancky CatthoorZeljko Zilic
Published in: ACM Great Lakes Symposium on VLSI (2015)
Keyphrases
  • reliability analysis
  • case study
  • relational databases
  • probabilistic model
  • statistical models