Simulation of Proton Induced Single Event Upsets in Bulk Nano-CMOS SRAMs.

Xuebing Cao Liyi Xiao Linzhe Li Jie Li Tianqi Wang

Published in: ICICDT (2019)

Keyphrases

high speed
monte carlo simulation
neural network
simulation study
simulation environment
multi agent
low cost
event detection
numerical simulations
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