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Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.
Hiroyuki Yotsuyanagi
Masaki Hashizume
Taisuke Iwakiri
Masahiro Ichimiya
Takeomi Tamesada
Published in:
DFT (2001)
Keyphrases
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electric field
data sets
neural network
real world
learning algorithm
pattern matching
statistical significance