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Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.

Hiroyuki YotsuyanagiMasaki HashizumeTaisuke IwakiriMasahiro IchimiyaTakeomi Tamesada
Published in: DFT (2001)
Keyphrases
  • electric field
  • data sets
  • neural network
  • real world
  • learning algorithm
  • pattern matching
  • statistical significance