Login / Signup

Investigation of normally-OFF AlGaN/GaN MIS-HEMTs with Al2O3/ZrOx/Al2O3 charge trapping layer.

Jiachen DuanYuanlei ZhangYe LiangYutao CaiWen Liu
Published in: ICICDT (2022)
Keyphrases
  • data structure
  • real time
  • neural network
  • information systems
  • multiscale
  • gray scale
  • multi layer
  • technical report