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Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices.

Yao WangSorin Dan CotofanaLiang Fang
Published in: NANOARCH (2012)
Keyphrases
  • reliability analysis
  • mobile devices
  • statistical models
  • statistical modeling
  • case study
  • real world
  • multi objective
  • input output
  • risk management
  • field effect transistors
  • fault tree