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Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices.
Yao Wang
Sorin Dan Cotofana
Liang Fang
Published in:
NANOARCH (2012)
Keyphrases
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reliability analysis
mobile devices
statistical models
statistical modeling
case study
real world
multi objective
input output
risk management
field effect transistors
fault tree