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A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology.
Hengliang Zhu
Xuan Zeng
Wei Cai
Jintao Xue
Dian Zhou
Published in:
DATE (2007)
Keyphrases
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high accuracy
clustering method
recognition process
neural network
detection method
case study
objective function
high precision
pairwise
significant improvement
edge detection
input output
spectral analysis