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Automated Design Error Localization in RTL Designs.
Maksim Jenihhin
Anton Tsepurov
Valentin Tihhomirov
Jaan Raik
Hanno Hantson
Raimund Ubar
Gunter Bartsch
Jorge Hernán Meza Escobar
Heinz-Dietrich Wuttke
Published in:
IEEE Des. Test (2014)
Keyphrases
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automated design
engineering design
evolutionary design
localization error
artificial immune algorithm
security protocols
distributed systems
neural network
low cost
genetic programming
evolutionary computation
mechanism design