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Parametric yield management for 3D ICs: Models and strategies for improvement.
Cesare Ferri
Sherief Reda
R. Iris Bahar
Published in:
ACM J. Emerg. Technol. Comput. Syst. (2008)
Keyphrases
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probabilistic model
complex systems
hidden markov models
yield management
machine learning
learning algorithm
prior knowledge
process model
statistical model
statistical models
computational models
parametric models