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A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture.

Tsuyoshi ShinogiHiroyuki YamadaTerumine HayashiShinji TsuruokaTomohiro Yoshikawa
Published in: Asian Test Symposium (2005)
Keyphrases
  • artificial intelligence
  • knowledge representation
  • test cases
  • multistage
  • reduction method
  • database
  • data mining
  • genetic algorithm
  • knowledge base
  • data structure
  • genetic programming
  • selection algorithm