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Prediction of Delamination Related IC & Packaging Reliability Problems.
W. D. van Driel
M. A. J. van Gils
Richard B. R. van Silfhout
G. Q. Zhang
Published in:
Microelectron. Reliab. (2005)
Keyphrases
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prediction accuracy
high speed
real world
feature selection
optimization problems
np complete
data mining
genetic algorithm
clustering algorithm
lower bound
simulated annealing
benchmark problems
computational biology
highly reliable