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Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits.

Behzad EghbalkhahMehdi KamalHassan Afzali-KushaAli Afzali-KushaM. B. Ghaznavi-GhoushchiMassoud Pedram
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • digital circuits
  • relational databases
  • response time
  • evolvable hardware
  • database
  • dynamic programming
  • evaluation methods
  • functional decomposition