COMPACTEST: a method to generate compact test sets for combinational circuits.
Irith PomeranzLakshmi N. ReddySudhakar M. ReddyPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1993)
Keyphrases
- test set
- experimental evaluation
- detection method
- error rate
- clustering method
- generation method
- high precision
- preprocessing
- significant improvement
- upper bound
- segmentation method
- test cases
- neural network
- computational cost
- training set
- high accuracy
- probabilistic model
- dynamic programming
- classification method
- objective function
- decision trees