Stacked LSTM Based Wafer Classification.
Neeta ShindeChandana SShashank Anand PatilK. Siri ChandanaNeha Tarannum PendariP. G. Sunitha HiremathShankar GangisettyPublished in: IEEE BigData (2021)
Keyphrases
- automatic classification
- image classification
- classification models
- pattern classification
- support vector machine svm
- classification accuracy
- pattern recognition
- support vector
- classification method
- supervised classification
- correct classification
- machine learning
- classification algorithm
- feature selection
- support vector machine
- classification scheme
- classification rate
- machine learning methods
- benchmark datasets
- text classification
- cost sensitive
- classification systems
- feature vectors
- accuracy rate
- automated classification
- document classification
- object classification
- class labels
- learning vector quantization
- classification process
- recurrent neural networks
- decision rules
- real time
- unsupervised learning
- recognition rate
- supervised learning
- hidden markov models
- preprocessing
- bayesian networks
- training data
- decision trees
- data sets