Wafer Die Position Detection Using Hierarchical Gray Level Corner Detector.

Jae Hyung Na Hae-Seok Oh

Published in: ICAISC (2004)

Keyphrases

gray level
corner detectors
corner detection
gray scale
detection algorithm
input image
texture analysis
gray level images
low contrast
texture features
edge detector
co occurrence
image segmentation
gray value
feature detectors
pixel values
texture images
binary images
detection method
high quality