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A Single-Configuration Method for Application-Dependent Testing of SRAM-based FPGA Interconnects.
Haider A. F. Almurib
T. Nandha Kumar
Fabrizio Lombardi
Published in:
Asian Test Symposium (2011)
Keyphrases
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high accuracy
computational cost
application dependent
experimental evaluation
computational complexity
preprocessing
cost function
learning algorithm
objective function
classification method
test data
high precision
feature extraction
high speed
clustering method
detection method
synthetic data
real time