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A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis.
Farid N. Najm
Noel Menezes
Imad A. Ferzli
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2007)
Keyphrases
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high level
probabilistic model
integrated circuit
statistical information
input data
computational model
mathematical model
experimental data
conceptual model
formal model
goodness of fit
feature selection
prediction model
statistical model
theoretical analysis
image analysis
decision trees