A new testing method for EEPLA.
Rochit RajsumanPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1994)
Keyphrases
- high accuracy
- preprocessing
- fully automatic
- synthetic data
- computational cost
- clustering method
- error rate
- test data
- experimental evaluation
- mutual information
- theoretical analysis
- main contribution
- training samples
- detection method
- experimental study
- statistical model
- high precision
- k means
- classification method
- face recognition