Login / Signup

Hot electron and hot hole induced degradation of SiGe p-FinFETs studied by degradation maps in the entire bias space.

Jacopo FrancoBen KaczerAdrian ChasinErik BuryDimitri Linten
Published in: IRPS (2018)
Keyphrases
  • real world
  • face recognition
  • hot topics
  • real time
  • search engine
  • clustering algorithm
  • reinforcement learning
  • multi agent
  • search algorithm
  • expert systems
  • search space
  • space time
  • higher dimensional