Elimination of Crucial Faults by a New Selective Testing Method.
Masayuki HirayamaTetsuya YamamotoJiro OkayasuOsamu MizunoTohru KikunoPublished in: ISESE (2002)
Keyphrases
- high accuracy
- preprocessing
- main contribution
- synthetic data
- clustering method
- objective function
- high precision
- classification method
- detection method
- support vector machine svm
- test data
- matching algorithm
- test cases
- error rate
- dynamic programming
- cost function
- significant improvement
- artificial neural networks
- neural network
- computationally efficient
- computational cost
- experimental evaluation
- segmentation method
- mathematical model
- training set
- optimization method
- evaluation method