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A soft-error-immune maintenance-free TCAM architecture with associated embedded DRAM.

Hideyuki NodaKatsumi DosakaFukashi MorishitaKazutami Arimoto
Published in: CICC (2005)
Keyphrases
  • content addressable
  • embedded dram
  • management system
  • random access memory
  • real time
  • power consumption
  • database systems
  • quality of service
  • design considerations
  • dynamic random access memory