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Thin Film of Vacuum Sputtering Process.

Wen-Hsien HoJinn-Tsong TsaiGong-Ming HsuJyh-Horng Chou
Published in: IEEE Trans Autom. Sci. Eng. (2010)
Keyphrases
  • thin film
  • case based reasoning
  • databases
  • expert systems
  • development process
  • multi layer
  • high density
  • electron microscopy