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Bayesian Estimation of Density via Multiple Sequential Inversions of Two-Dimensional Images With Application to Electron Microscopy.

Dalia ChakrabartyNare GabrielyanFabio RigatRichard BeanlandShashi Paul
Published in: Technometrics (2015)
Keyphrases
  • electron microscopy
  • bayesian estimation
  • three dimensional
  • x ray
  • low energy
  • thin film
  • edge detection
  • microscopy images
  • machine learning
  • similarity measure
  • probabilistic model
  • co occurrence
  • image stacks