A Design-Based Structural Test Method for a Switched-Resistor DAC.
Lei MaGeert SeurenRobert Van RijsingeCorné BastiaansenLeon van der DussenPublished in: J. Electron. Test. (2007)
Keyphrases
- test data
- classification method
- computational cost
- clustering method
- high accuracy
- high precision
- preprocessing
- pairwise
- prior knowledge
- case study
- structural information
- synthetic data
- probabilistic model
- significant improvement
- computational complexity
- neural network
- edge detection
- image quality
- maximum likelihood
- theoretical analysis
- detection algorithm
- design process
- cost function
- objective function