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Optimization-Based Artifact Correction for Electron Microscopy Image Stacks.

Samaneh AzadiJeremy Maitin-ShepardPieter Abbeel
Published in: ECCV (2) (2014)
Keyphrases
  • image stacks
  • electron microscopy
  • x ray
  • low energy
  • tubular structures
  • optimization process
  • thin film
  • neural network
  • image segmentation
  • transmission electron microscopy