An Efficient Wavelet Based Transient Current Test towards Detection of Data Retention Faults in SRAM.
Princy PSivamangai N. M.Published in: J. Electron. Test. (2019)
Keyphrases
- data sets
- database
- test data
- data collection
- data acquisition
- detection algorithm
- image data
- knowledge discovery
- data analysis
- training data
- probability distribution
- raw data
- experimental data
- spatial data
- test cases
- synthetic data
- data processing
- high quality
- statistical analysis
- computer systems
- data structure
- data distribution
- databases
- data points
- data transmission