Multichip Module Diagnosis by Product-Code Signatures.

Prawat Nagvajara J. Lin P. Nilagupta C. Wang

Published in: J. Electron. Test. (1997)

Keyphrases

life cycle
medical diagnosis
fault diagnosis
binary codes
neural network
model based diagnosis
fault detection
signature verification
product development
product quality
artificial intelligence
multiscale
source code
constraint satisfaction
heart disease
code generation