A retention-aware test power model for embedded SRAM.

Baosheng Wang Josh Yang Yuejian Wu André Ivanov

Published in: ASP-DAC (2005)

Keyphrases

management system
mathematical model
em algorithm
high level
knowledge base
objective function
data structure
prior knowledge
formal model
theoretical analysis
computational model
low power
real time
process model
expectation maximization
high speed
probabilistic model