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SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation.
Keita Yoshida
Ryuichi Nakajima
Shotaro Sugitani
Takafumi Ito
Jun Furuta
Kazutoshi Kobayashi
Published in:
ICICDT (2023)
Keyphrases
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real time
computer vision
database systems
sensitivity analysis
artificial intelligence
social networks
three dimensional
multiscale
multi agent
process model
integrated circuit
evolution process