Login / Signup

SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation.

Keita YoshidaRyuichi NakajimaShotaro SugitaniTakafumi ItoJun FurutaKazutoshi Kobayashi
Published in: ICICDT (2023)
Keyphrases
  • real time
  • computer vision
  • database systems
  • sensitivity analysis
  • artificial intelligence
  • social networks
  • three dimensional
  • multiscale
  • multi agent
  • process model
  • integrated circuit
  • evolution process