Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator.
Alfred V. GomesAbhijit ChatterjeePublished in: Asian Test Symposium (2001)
Keyphrases
- dimensionality reduction
- feature extraction
- euclidean distance
- data generator
- principal component analysis
- low dimensional
- test data
- fault detection
- pattern recognition
- high dimensional data
- distance function
- high dimensional
- feature selection
- pattern recognition and machine learning
- distance measure
- linear discriminant analysis
- high dimensionality
- manifold learning
- data representation
- feature space
- random projections
- transmission line
- minimum distance
- structure preserving