Test and Yield Loss Reduction of AI and Deep Learning Accelerators.

Mehdi Sadi Ujjwal Guin

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)

Keyphrases

deep learning
machine learning
unsupervised learning
unsupervised feature learning
artificial intelligence
decision making
mental models
weakly supervised
expert systems
clustering algorithm
feature space
co occurrence
higher order
domain specific