Fast detection of data retention faults and other SRAM cell open defects.
Josh YangBaosheng WangYuejian WuAndré IvanovPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
- data sets
- database
- training data
- statistical analysis
- data collection
- high quality
- data analysis
- data distribution
- data sources
- data processing
- data objects
- raw data
- data acquisition
- high dimensional data
- computer systems
- long term
- data structure
- data mining techniques
- low cost
- sensor networks
- image data
- data points
- probability distribution
- synthetic data
- wireless sensor networks
- power consumption
- neural network