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Degradation mapping in high power IGBT modules using four-point probing.

Kristian Bonderup PedersenLotte Haxen ØstergaardPramod GhimireVladimir N. PopokKjeld Pedersen
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • high power
  • low power
  • high density
  • power supply
  • real time
  • simulation software
  • low cost
  • power consumption