Testability Features of the Alpha 21364 Microprocessor.

Scott Erlanger Dilip K. Bhavsar Richard A. Davies

Published in: ITC (2003)

Keyphrases

feature vectors
high speed
feature extraction
support vector
feature space
feature set
co occurrence
rich set
specific features
feature detection
structural information
false positives
benchmark datasets
real time
low level
high level
learning algorithm