Gate sizing: finFETs vs 32nm bulk MOSFETs.

Brian Swahn Soha Hassoun

Published in: DAC (2006)

Keyphrases

low voltage
leakage current
cmos technology
low power
power line
nm technology
design considerations
power consumption
power management
parallel processing
power losses
power dissipation
high speed
image processing
computer vision
image sensor
medical images
database systems
neural network