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Designing for scan test of high performance embedded memories.

E. Kofi Vida-TorkuGeorge Joos
Published in: ITC (1998)
Keyphrases
  • embedded processors
  • embedded systems
  • real time
  • high efficiency
  • scan data
  • databases
  • neural network
  • multi agent systems
  • evolutionary algorithm
  • test cases
  • statistical tests
  • statistical significance