Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM.
Cheng XieYueyue ChenJianjun ChenJizuo ZhangPublished in: Sci. China Inf. Sci. (2019)
Keyphrases
- cmos technology
- power consumption
- nm technology
- low power
- random access memory
- low voltage
- silicon on insulator
- leakage current
- parallel processing
- metal oxide semiconductor
- high speed
- low cost
- power dissipation
- power reduction
- embedded dram
- power management
- circuit design
- data transmission
- integrated circuit
- density function
- dynamic random access memory
- dependency relations
- design considerations
- analog vlsi