Assessment of event-related potential of independent components for intended direction classification.
Hyeonseok KimNatsue YoshimuraYasuharu KoikePublished in: SMC (2020)
Keyphrases
- event related
- independent components
- independent component analysis
- feature vectors
- pattern classification
- feature selection
- pattern recognition
- classification accuracy
- support vector
- feature space
- computer vision
- supervised learning
- feature set
- unsupervised learning
- topic models
- data analysis
- brain computer interface
- blind source separation
- feature extraction
- machine learning
- independent components analysis