Sequential Test for Arbitrary Ratio of Mean Times Between Failures.

Yefim Haim Michlin Dov Ingman Yoram Dayan

Published in: Int. J. Oper. Res. Inf. Syst. (2011)

Keyphrases

data sets
failure rate
databases
real world
artificial intelligence
bayesian networks
wide range
data structure
artificial neural networks
multiresolution
special case
statistical tests