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Dual Entropy-Controlled Convolutional Neural Network for Mini/Micro LED Defect Recognition.
Yuxiang Wang
Jie Chu
Yu Chen
Dong Liang
Kailin Wen
Jueping Cai
Published in:
IEEE Trans. Instrum. Meas. (2023)
Keyphrases
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convolutional neural network
face detection
mutual information
recognition rate
computer controlled
database
neural network
object recognition
information theoretic
information theory
primal dual
pattern recognition
recognition accuracy
shape recognition
information entropy